FG

Frank D. Guiffrida

PI Pictometry International: 1 patents #5 of 5Top 100%
📍 Honeoye Falls, NY: #17 of 47 inventorsTop 40%
🗺 New York: #3,659 of 10,473 inventorsTop 35%
Overall (2011): #303,503 of 364,097Top 85%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7995799 Method and apparatus for capturing geolocating and measuring oblique images Stephen L. Schultz, Robert Gray, Charles Mondello 2011-08-09