Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8074133 | Method and apparatus for testing delay faults | Kevin D. Woodling, Robert F. Molyneaux | 2011-12-06 |
| 8065572 | At-speed scan testing of memory arrays | Murali M. R. Gala, Paul J. Dickinson, Karl P. Dahlgren, David L. Curwen, Oliver Caty +3 more | 2011-11-22 |