YF

Yoshiki Fujii

OM Omron: 1 patents #51 of 193Top 30%
Overall (2011): #124,033 of 364,097Top 35%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7961933 Method of setting reference data for inspection of fillets and inspection device using same Yasutomo Doi, Akira Nakajima, Toshihiro Moriya, Yasuaki Nakajima 2011-06-14