Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8028567 | AFM tweezers, method for producing AFM tweezers, and scanning probe microscope | Tatsuya Kobayashi, Masato Suzuki, Masatoshi Yasutake | 2011-10-04 |
| 7926328 | Sample manipulating apparatus | Masatoshi Yasutake, Masafumi Watanabe | 2011-04-19 |
| 7873432 | Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis | Nobuyuki Ohminami, Masaru Tanaka | 2011-01-18 |
| 7874016 | Scanning probe microscope and scanning method | Norio Ookubo | 2011-01-18 |
| 7866205 | Sample operation apparatus | Masatoshi Yasutake | 2011-01-11 |