Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7994807 | Built-in test circuit for testing AC transfer characteristic of high-speed analog circuit | Babak Matinpour, Vijaya Ceekala | 2011-08-09 |
| 7902013 | Method of forming a semiconductor die with reduced RF attenuation | Jeffrey A. Babcock | 2011-03-08 |