Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8018246 | Semiconductor device | Nakaba Kaiwa | 2011-09-13 |
| 8008089 | Method and system for checking measurement result | Masakazu Fukuda, Hiromi Onomichi | 2011-08-30 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8018246 | Semiconductor device | Nakaba Kaiwa | 2011-09-13 |
| 8008089 | Method and system for checking measurement result | Masakazu Fukuda, Hiromi Onomichi | 2011-08-30 |