Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7990163 | Systems and methods for defect testing of externally accessible integrated circuit interconnects | Masayoshi Nomura | 2011-08-02 |
| 7933162 | Row addressing | Takuya Nakanishi, Takumi Nasu | 2011-04-26 |
| 7910061 | Colorimetric absorbance measurement apparatus | Yasuhiro Higuchi | 2011-03-22 |
| 7885128 | Redundant memory array for replacing memory sections of main memory | — | 2011-02-08 |