Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8044479 | Transistors, semiconductor devices, assemblies and constructions | Xiawan Yang | 2011-10-25 |
| 7883907 | Parameter measurement using multi-layer structures | — | 2011-02-08 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8044479 | Transistors, semiconductor devices, assemblies and constructions | Xiawan Yang | 2011-10-25 |
| 7883907 | Parameter measurement using multi-layer structures | — | 2011-02-08 |