JF

John R. C. Futrell

Micron: 1 patents #329 of 782Top 45%
📍 Boise, ID: #212 of 511 inventorsTop 45%
🗺 Idaho: #340 of 944 inventorsTop 40%
Overall (2011): #262,512 of 364,097Top 75%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8037446 Methods for defining evaluation points for optical proximity correction and optical proximity correction methods including same Ezequiel Vidal Russell, William A. Stanton 2011-10-11