SF

Shawn De Foney

MI Metrologic Instruments: 1 patents #36 of 54Top 70%
📍 Haddon Heights, NJ: #3 of 5 inventorsTop 60%
🗺 New Jersey: #1,952 of 6,350 inventorsTop 35%
Overall (2011): #168,646 of 364,097Top 50%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8047438 Digital image capture and processing system employing an image formation and detection subsystem having an area-type image detection array supporting periodic occurrance of snap-shot type image acquisition cycles at a high-repetition rate during object illumination Anatoly Kotlarsky, Xiaoxun Zhu, Michael Veksland, Ka Man Au, Patrick Giordano +8 more 2011-11-01