Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8081532 | Semiconductor device having variable parameter selection based on temperature and test method | — | 2011-12-20 |
| 8049145 | Semiconductor device having variable parameter selection based on temperature and test method | — | 2011-11-01 |
| 8040742 | Semiconductor device having variable parameter selection based on temperature and test method | — | 2011-10-18 |
| 8005641 | Temperature sensing circuit with hysteresis and time delay | — | 2011-08-23 |
| 7953573 | Semiconductor device having variable parameter selection based on temperature and test method | — | 2011-05-31 |