Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8006149 | System and method for device performance characterization in physical and logical domains with AC SCAN testing | Richard C. Dokken, Gerald Chan | 2011-08-23 |
| 7865788 | Dynamic mask memory for serial scan testing | Mei-Mei Su, John K. Frediani | 2011-01-04 |