Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7901132 | Method of identifying crystal defect region in monocrystalline silicon using metal contamination and heat treatment | Sang-Wook Wee, Seung Wook Lee, Kwang-Salk Kim | 2011-03-08 |