MK

Masayoshi Kobayashi

NE Nec: 2 patents #80 of 807Top 10%
HC Hitachi Ulsi Systems Co.: 1 patents #12 of 87Top 15%
RE Renesas Electronics: 1 patents #438 of 1,509Top 30%
Tdk: 1 patents #191 of 474Top 45%
Overall (2011): #24,585 of 364,097Top 7%
4
Patents 2011

Issued Patents 2011

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
8076202 Method of fabricating semiconductor device Sumito Numazawa, Yoshito Nakazawa, Satoshi Kudo, Yasuo Imai, Sakae Kubo +4 more 2011-12-13
8064340 Quality-degraded portion estimating apparatus, quality-degraded portion estimating method, and quality-degraded portion estimating program 2011-11-22
8036121 Method of estimating quality degradation on network in communication network system 2011-10-11
7987968 Chip component carrying method and system, and visual inspection method and system Toru Mizuno 2011-08-02