Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8037376 | On-chip failure analysis circuit and on-chip failure analysis method | Kenichi Anzou | 2011-10-11 |
| 8032803 | Semiconductor integrated circuit and test system thereof | Kenichi Anzou | 2011-10-04 |
| 7962821 | Built-in self testing circuit with fault diagnostic capability | Kenichi Anzou | 2011-06-14 |