DK

Detlef Knebel

JA Jpk Instruments Ag: 2 patents #1 of 4Top 25%
Overall (2011): #103,941 of 364,097Top 30%
2
Patents 2011

Issued Patents 2011

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
7971266 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope Torsten Jähnke, Torsten Müller, Kathryn Anne Poole 2011-06-28
7934323 Method and a device for the positioning of a displaceable component in an examining system Torsten Jähnke 2011-05-03