Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7962302 | Predicting wafer failure using learned probability | Robert J. Baseman, Susan G. Conti, Michal Rosen-Zvi, Frederick A. Scholl | 2011-06-14 |
| 7957826 | Methods for normalizing error in photolithographic processes | Christopher P. Ausschnitt, Richard H. Broberg, David Crow, Keith Roberts | 2011-06-07 |
| 7879515 | Method to control semiconductor device overlay using post etch image metrology | Christopher P. Ausschnitt | 2011-02-01 |