Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8006153 | Multiple uses for BIST test latches | Garrett Stephen Koch, Osamu Takahashi, Michael Brian White | 2011-08-23 |
| 7908536 | Testing functional boundary logic at asynchronous clock boundaries of an integrated circuit device | Nathan P. Chelstrom, Mack W. Riley | 2011-03-15 |