Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8004305 | Electronic circuit for measurement of transistor variability and the like | Jae-Joon Kim, Rahul M. Rao | 2011-08-23 |
| 7880518 | Method and apparatus for measuring and compensating for static phase error in phase locked loops | — | 2011-02-01 |
| 7863918 | Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits | Seongwon Kim | 2011-01-04 |