Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7917897 | Defect resolution methodology and target assessment process with a software system | Brian Richard Lepel, Warren James Leslie, Susan E. Skrabanek, Crystal F. Springer, Nathan G. Steffenhagen | 2011-03-29 |