JA

Javier Ayala

IBM: 1 patents #3,726 of 9,568Top 40%
📍 Poughkeepsie, NY: #121 of 280 inventorsTop 45%
🗺 New York: #3,659 of 10,473 inventorsTop 35%
Overall (2011): #278,064 of 364,097Top 80%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7881891 Automated dynamic metrology sampling system and method for process control Marc J. Postiglione, Eric P. Solecky 2011-02-01