Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7884924 | Residual stress measuring method and system | Shohei Numata, Atsushi Baba | 2011-02-08 |
| 7872472 | Eddy current testing apparatus and eddy current testing method | Yutaka Suzuki, Masahiro Koike, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura +4 more | 2011-01-18 |