Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086889 | Semiconductor integrated circuit device for scan testing | Yuichi Ito, Yasuhiro Fujimura, Shigeru Nakahara | 2011-12-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086889 | Semiconductor integrated circuit device for scan testing | Yuichi Ito, Yasuhiro Fujimura, Shigeru Nakahara | 2011-12-27 |