EH

Eiji Harada

RE Renesas Electronics: 2 patents #175 of 1,509Top 15%
Overall (2011): #102,396 of 364,097Top 30%
2
Patents 2011

Issued Patents 2011

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
7934136 Test apparatus, pattern generator, test method and pattern generating method — 2011-04-26
7873887 Burn-in test circuit, burn-in test method, burn-in test apparatus, and a burn-in test pattern generation program product — 2011-01-18