Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7928384 | Localized static charge distribution precision measurement method and device | Tasuku Yano, Seiko Omori | 2011-04-19 |
| 7910884 | Apparatus and method for inspection and measurement | Natsuki Tsuno | 2011-03-22 |