Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8031421 | Method for measuring optimum seeking time and inspection apparatus using the same | Kenichi Shitara | 2011-10-04 |
| 7903361 | Method of detecting scratch defect in circumferential direction and magnetic disk certifier | Yasuhiro Tokumaru | 2011-03-08 |