Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973280 | Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same | Haruo Takahashi, Yutaka Ikku, Kouji Iwasaki | 2011-07-05 |