SC

Shih-Tsuan Chang

HM Hermes Microvision: 1 patents #15 of 27Top 60%
Overall (2011): #169,069 of 364,097Top 50%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8063363 Method and apparatus for charged particle beam inspection Chang-Chun Yeh 2011-11-22