Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8055058 | Apparatus and method for detecting defects in wafer using line sensor camera | Jong-Kyu Han, Byoung-Moon Hwang, Jin Seob Kim | 2011-11-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8055058 | Apparatus and method for detecting defects in wafer using line sensor camera | Jong-Kyu Han, Byoung-Moon Hwang, Jin Seob Kim | 2011-11-08 |