Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7948618 | Defect inspection method and apparatus with a threshold value determination | Naohiro Takahashi, Tamihide Yasumoto | 2011-05-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7948618 | Defect inspection method and apparatus with a threshold value determination | Naohiro Takahashi, Tamihide Yasumoto | 2011-05-24 |