Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973914 | Physical quantity measuring apparatus utilizing optical frequency domain reflectometry and method for temperature and strain measurement using the apparatus | Akira Sakamoto, Shunichirou Hirafune | 2011-07-05 |
| 7889332 | Physical quantity measuring apparatus utilizing optical frequency domain reflectometry, and method for simultaneous measurement of temperature and strain using the apparatus | Akira Sakamoto, Shunichirou Hirafune | 2011-02-15 |