Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8044344 | Mass spectroscope | Masayuki Naya, Naoki Murakami | 2011-10-25 |
| 8045171 | Inspection chip producing method and specimen detecting method | Naoki Murakami | 2011-10-25 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8044344 | Mass spectroscope | Masayuki Naya, Naoki Murakami | 2011-10-25 |
| 8045171 | Inspection chip producing method and specimen detecting method | Naoki Murakami | 2011-10-25 |