Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7941718 | Electronic device testing system | Robert L. Bailey | 2011-05-10 |
| 7865759 | Programmable clock control architecture for at-speed testing | Kevin Mun-Wah Chan, Brian Rust | 2011-01-04 |