Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7897918 | System and method for focused ion beam data analysis | Michael William Phaneuf, Michael A. Anderson | 2011-03-01 |
| 7893397 | Apparatus and method for surface modification using charged particle beams | Michael William Phaneuf, Alexander Krechmer | 2011-02-22 |