MB

MART PETRUS MARIA BIERHOFF

FE Fei: 1 patents #9 of 65Top 15%
📍 Deurne, NL: #4 of 6 inventorsTop 70%
Overall (2011): #230,641 of 364,097Top 65%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7906762 Compact scanning electron microscope Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more 2011-03-15