Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051348 | Integrated circuit testing using segmented scan chains | — | 2011-11-01 |
| 7984358 | Error-correction memory architecture for testing production errors | Eitan Joshua | 2011-07-19 |
| 7949908 | Memory repair system and method | Reshef Bar Yoel, Michael Levi, Yosef Haviv | 2011-05-24 |
| 7886207 | Integrated circuit testing using segmented scan chains | — | 2011-02-08 |