Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7989338 | Grain boundary blocking for stress migration and electromigration improvement in CU interconnects | Fan Zhang, Alex See, Cheng Tan, Xiaomei Bu, Tae Jong Lee +1 more | 2011-08-02 |