Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8006156 | Method of generating test condition for detecting delay faults in semiconductor integrated circuit and apparatus for generating the same | — | 2011-08-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8006156 | Method of generating test condition for detecting delay faults in semiconductor integrated circuit and apparatus for generating the same | — | 2011-08-23 |