Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
OG

Ophir Gvirtzer

Applied Materials: 1 patents #339 of 828Top 45%
Overall (2011): #201,145 of 364,097Top 60%
1 Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7970201 Method and system for defect detection Michael Ben-Yishay 2011-06-28