Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7969564 | System and method for defect localization on electrical test structures | Gilad Almogy, Lior Levin | 2011-06-28 |
CT
Chris Talbot
Overall (2011): #330,293 of 364,097Top 95%
1
Patents 2011