Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7916286 | Defect detection through image comparison using relative measures | Oren Cohen | 2011-03-29 |
| 7869643 | Advanced cell-to-cell inspection | Zeev Litichever, Oren Cohen | 2011-01-11 |