Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7974801 | Method and system for a two-step prediction of a quality distribution of semiconductor devices | — | 2011-07-05 |
| 7908109 | Identifying manufacturing disturbances using preliminary electrical test data | Lothar Waetzold, Thomas Depaly | 2011-03-15 |