YF

Yasuo Furukawa

AD Advantest: 2 patents #14 of 142Top 10%
TT The University Of Tokyo: 1 patents #27 of 138Top 20%
📍 Tokyo, CA: #127 of 268 inventorsTop 50%
Overall (2011): #57,602 of 364,097Top 20%
2
Patents 2011

Issued Patents 2011

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
7984353 Test apparatus, test vector generate unit, test method, program, and recording medium Gorschwin Fey, Satoshi Komatsu, Masahiro Fujita 2011-07-19
7948256 Measurement apparatus, test system, and measurement method for measuring a characteristic of a device 2011-05-24