KM

Kunihiro Matsuura

AD Advantest: 1 patents #37 of 142Top 30%
Overall (2011): #239,056 of 364,097Top 70%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7973543 Measurement apparatus, test apparatus and measurement method Hiroki Andoh, Satoshi Kodera 2011-07-05