Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6692878 | Photomask frame modification to eliminate process induced critical dimension control variation | Wilman Tsai, Marilyn Kamna, Jeff Farnsworth | 2004-02-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6692878 | Photomask frame modification to eliminate process induced critical dimension control variation | Wilman Tsai, Marilyn Kamna, Jeff Farnsworth | 2004-02-17 |