Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6818894 | Method and apparatus for characterization of ultrathin silicon oxide films using mirror-enhanced polarized reflectance fourier transform infrared spectroscopy | Christos G. Takoudis | 2004-11-16 |
| 6790707 | Method of preparing a sample of a semiconductor structure for adhesion testing | — | 2004-09-14 |