Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6819124 | Detection of electromigration in integrated circuits | David R. Allee | 2004-11-16 |
| 6750124 | Direct patterning of nanometer-scale silicide structures on silicon by ion-beam implantation through a thin barrier layer | Martin M. Mitan, David Pivin, James W. Mayer | 2004-06-15 |