Issued Patents 2004
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6813738 | IC test cell with memory output connected to input multiplexer | — | 2004-11-02 |
| 6804725 | IC with state machine controlled linking module | — | 2004-10-12 |
| 6779133 | IC with two state machines connected to serial scan path | — | 2004-08-17 |
| 6769080 | Scan circuit low power adapter with counter | — | 2004-07-27 |
| 6766487 | Divided scan path with decode logic receiving select control signals | Jayashree Saxena | 2004-07-20 |
| 6763487 | IC with latching and switched I/O buffers | — | 2004-07-13 |
| 6763488 | Generator/compactor scan circuit low power adapter with counter | — | 2004-07-13 |
| 6763485 | Position independent testing of circuits | — | 2004-07-13 |
| 6731106 | Measuring on-resistance of an output buffer with test terminals | — | 2004-05-04 |
| 6728915 | IC with shared scan cells selectively connected in scan path | — | 2004-04-27 |
| 6727722 | Process of testing a semiconductor wafer of IC dies | — | 2004-04-27 |
| 6717429 | IC having comparator inputs connected to core circuitry and output pad | — | 2004-04-06 |
| 6711707 | Process of controlling plural test access ports | Baher Haroun | 2004-03-23 |
| 6694465 | Low overhead input and output boundary scan cells | — | 2004-02-17 |
| 6694467 | Low power testing of very large circuits | — | 2004-02-17 |
| 6678188 | Quad state memory design methods, circuits, and systems | — | 2004-01-13 |
| 6675333 | Integrated circuit with serial I/O controller | Benjamin H. Ashmore, Jr. | 2004-01-06 |