Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6834246 | Multiprobe blob test in lieu of 100% probe test | Todd Stubblefield, Eugene Gharis | 2004-12-21 |
| 6718227 | System and method for determining a position error in a wafer handling device | Floyd Schemmel, Troy W. Hoehner | 2004-04-06 |