Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6768327 | Testing head having vertical probes for semiconductor integrated electronic devices | Giuseppe Crippa | 2004-07-27 |
| 6674298 | Testing head having cantilever probes | Giuseppe Crippa | 2004-01-06 |